Dr. Zhifu Feng

Young Talent, Postdoctoral Fellow

Dr. Zhifu Feng received his Ph.D. in January 2023 from the University of Ferrara in partnership with the Bruno Kessler Foundation, with a specialization in semiconductor physics and micro/nanofabrication. From October 2019 to January 2023 he developed semiconductor gas-sensor devices and carried out comprehensive materials characterization, gaining hands-on expertise with MEMS process flows—optical and e-beam lithography, thin-film deposition (sputtering, e-beam evaporation, ALD), dry/wet etching (RIE/ICP, TMAH), wafer bonding, lift-off, metallization, and packaging/assembly (wire-/flip-chip bonding, underfill, PCB integration). His characterization experience spans SEM/AFM, XRD, Raman/PL, XPS, Hall measurements, electrical IV/CV, and environmental testing with controlled temperature/humidity and calibrated gas delivery, complemented by multiphysics/device simulation using COMSOL and MATLAB. In February 2023 he joined the Italian Institute of Technology as a postdoctoral researcher, where he works on an European Space Agency-funded program focused on X-ray/gamma-ray detector fabrication and evaluation, including 3D electrodes fabrication based on MEMS technology, halid perovskite material synthesis, devices measurements. In this ESA project, his group firstly invented 3D X-ray detector with super high sensitivity.